ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
Status: PublishedPublication date: 2015-07
Edition: 1Number of pages: 20
Technical Committee: ISO/TC 172/SC 9 Laser and electro-optical systems
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|std 1 124|
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