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Abstract Preview

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.


General information

  • Status :  Published
    Publication date : 2009-09
  • Edition : 1
    Number of pages : 43
  • Technical Committee
    :
    ISO/TC 202
    Microbeam analysis
  • ICS :
    71.040.50
    Physicochemical methods of analysis

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