ISO/TS 11888:2011
ISO/TS 11888:2011


ISO/TS 11888:2011 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy, transmission electron microscopy, viscometry, and light scattering analysis.

ISO/TS 11888:2011 also includes additional terms needed to define the characterization of scattered bending persistence length (SBPL). Two approximation methods are given for the evaluation of SBPL.

Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

General information 

  •  :  Withdrawn
     : 2011-11
  •  : 1
     : 17
  •  : ISO/TC 229 Nanotechnologies
  •  :
    07.120 Nanotechnologies

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