This standard was last reviewed and confirmed in 2017. Therefore this version remains current.
Abstract Preview
Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
General information
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Status : PublishedPublication date : 1996-12
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Edition : 2Number of pages : 13
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Technical Committee:Dimensional and geometrical product specifications and verification
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- ICS :
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Measuring instruments
Buy this standard
| Format | Language | |
|---|---|---|
| Paper |
- CHF88
Life cycle
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Previously
WithdrawnISO 1880:1979
WithdrawnISO 3274:1975
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Now
Corrigenda / Amendments
PublishedISO 3274:1996/Cor 1:1998
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