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Abstract Preview

Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.


General information

  • Status :  Published
    Publication date : 1996-12
  • Edition : 2
    Number of pages : 13
  • Technical Committee
    :
    ISO/TC 213
    Dimensional and geometrical product specifications and verification
  • ICS :
    17.040.30
    Measuring instruments

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  • CHF88

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