Abstract 

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.


General information

  • Status :  Withdrawn
    Publication date : 1993-08
  • Edition : 1
    Number of pages : 3
  • :
    ISO/TC 171/SC 2
    Document file formats, EDMS systems and authenticity of information
  • 37.080
    Document imaging applications

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