Résumé
PrévisualiserThis document defines the most important quantities that characterize an energy-dispersive X‑ray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts. This document is only applicable to spectrometers with semiconductor detectors operating on the principle of solid-state ionization. This document specifies minimum requirements and how relevant instrumental performance parameters are to be checked for such spectrometers attached to a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA). The procedure used for the actual analysis is outlined in ISO 22309[2] and ASTM E1508[3] and is outside the scope of this document.
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État actuel: PubliéeDate de publication: 2021-02
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Edition: 3
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- ICS :
- 71.040.99 Autres normes relatives à la chimie analytique
Acheter cette norme
| Format | Langue | |
|---|---|---|
| std 1 92 | PDF + ePub | |
| std 2 92 | Papier |
- CHF92
Cycle de vie
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Précédemment
AnnuléeISO 15632:2012
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Actuellement
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