Abstract
PreviewThis document is intended to aid the operators of X-ray photoelectron spectrometers in their analysis of typical samples. It takes the operator through the analysis from the handling of the sample and the calibration and setting-up of the spectrometer to the acquisition of wide and narrow scans and also gives advice on quantification and on preparation of the final report.
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Status: PublishedPublication date: 2019-08
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Edition: 2Number of pages: 32
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- ICS :
- 71.040.40 Chemical analysis
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| Format | Language | |
|---|---|---|
| std 1 145 | PDF + ePub | |
| std 2 145 | Paper |
- CHF145
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