Abstract
PreviewISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.
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Status: PublishedPublication date: 2015-11
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Edition: 1Number of pages: 22
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- ICS :
- 71.040.40 Chemical analysis
Buy this standard
| Format | Language | |
|---|---|---|
| std 1 124 | PDF + ePub | |
| std 2 124 | Paper |
- CHF124
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