This standard was last reviewed and confirmed in 2019. Therefore this version remains current.
ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
Status : PublishedPublication date : 2014-01
Edition : 2Number of pages : 10
Technical Committee:Electron probe microanalysis
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