This standard was last reviewed and confirmed in 2018. Therefore this version remains current.
Abstract Preview
ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
General information
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Status : PublishedPublication date : 2012-12
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Edition : 1Number of pages : 33
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- ICS :
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Chemical analysis
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