ISO 23201:2015
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ISO 23201:2015
50501

Abstract  Preview

ISO 23201:2015 sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel. These elements are expressed as the oxides Na2O, SiO2, Fe2O3, CaO, TiO2, P2O5, V2O5, ZnO, MnO, Ga2O3, K2O, CuO, Cr2O3, and NiO on an un-dried sample basis. The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is also given.


General information 

  •  :  Published
     : 2015-11
  •  : 1
     : 32
  •  : ISO/TC 226 Materials for the production of primary aluminium
  •  :
    71.100.10 Materials for aluminium production

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