ISO 24173:2009 Preview
Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
This standard was last reviewed and confirmed in 2015. Therefore this version remains current.
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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