ISO 18452:2005 Preview
Fine ceramics (advanced ceramics, advanced technical ceramics) -- Determination of thickness of ceramic films by contact-probe profilometer
This standard was last reviewed and confirmed in 2014. Therefore this version remains current.
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
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