Abstract Preview

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.


General information

  • Status :  Published
    Publication date : 2005-11
  • Edition : 1
    Number of pages : 9
  • :
    ISO/TC 206
    Fine ceramics
  • 81.060.30
    Advanced ceramics

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Life cycle

A standard is reviewed every 5 years



Revisions / Corrigenda

  • Now confirmed
    ISO 18452:2005

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