ISO 15632:2002

Microbeam analysis -- Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

ISO 15632 defines the most important quantities that characterize an energy dispersive X-ray spectrometer (EDS) consisting of a semiconductor detector, a pre-amplifier and a signal processing unit as the essential parts. This International Standard is only applicable to spectrometers with semiconductor detectors operating on the principle of solid state ionization. It specifies minimum requirements for such spectrometers attached to an electron probe microanalyser (EPMA) or a scanning electron microscope (SEM). Realization of the analysis is outside the scope of this International Standard.


General information

  • Status :  Withdrawn
    Publication date : 2002-12
  • Edition : 1
  • :
    ISO/TC 202
    Microbeam analysis
  • 37.020
    Optical equipment
    71.040.99
    Other standards related to analytical chemistry

Life cycle

A standard is reviewed every 5 years



Revisions / Corrigenda

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