Abstract 

Describes the metrological characteristics of phase correct filters for the measurement of surface profiles. In particular it specifies how to separate the long and short wave content of a surface profile.


General information

  • Status :  Withdrawn
    Publication date : 1996-12
  • Edition : 1
    Number of pages : 8
  • Technical Committee
    :
    ISO/TC 213
    Dimensional and geometrical product specifications and verification
  • ICS :
    17.040.20
    Properties of surfaces

Life cycle

A standard is reviewed every 5 years



Revisions / Corrigenda

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