Abstract
Establishes a reference system incorporating all calibrated motions of rotation and displacement on the microscope and its accessories so that the measuring procedures are uniform. Particular attention is given to the polarization parameters and measuring accessories.
General information
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Status: PublishedPublication date: 1996-12Stage: International Standard confirmed [90.93]
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Edition: 1Number of pages: 6
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Technical Committee :ISO/TC 172/SC 5ICS :37.020
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