Standards catalogue

ISO/TC 202/SC 3

Analytical electron microscopy

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Standard and/or project under the direct responsibility of ISO/TC 202/SC 3 Secretariat Stage ICS
ISO 19214:2017
Microbeam analysis -- Analytical electron microscopy -- Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
60.60
ISO 20263:2017
Microbeam analysis -- Analytical electron microscopy -- Method for the determination of interface position in the cross-sectional image of the layered materials
60.60
ISO/CD 23420 [Under development]
Microbeam analysis -- Analytical electron microscopy -- Method for the determination of energy resolution for electron energy loss spectrum analysis
30.20
ISO 25498:2010 [Withdrawn]
Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
95.99
ISO 25498:2018
Microbeam analysis -- Analytical electron microscopy -- Selected area electron diffraction analysis using a transmission electron microscope
60.60
ISO 29301:2010 [Withdrawn]
Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures
95.99
ISO 29301:2017
Microbeam analysis -- Analytical electron microscopy -- Methods for calibrating image magnification by using reference materials with periodic structures
60.60

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