Standards catalogue

ISO/TC 202/SC 1

Terminology

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Standard and/or project under the direct responsibility of ISO/TC 202/SC 1 Secretariat Stage ICS
ISO 15932:2013
Microbeam analysis -- Analytical electron microscopy -- Vocabulary
90.60
ISO 22493:2008 [Withdrawn]
Microbeam analysis -- Scanning electron microscopy -- Vocabulary
95.99
ISO 22493:2014
Microbeam analysis -- Scanning electron microscopy -- Vocabulary
90.20
ISO/AWI 23699 [Under development]
Microbeam Analysis -- Electron Backscattered Electron Diffraction -- Vocabulary
20.00
ISO 23833:2006 [Withdrawn]
Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
95.99
ISO 23833:2013
Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
90.60

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