This document identifies information to be collected and reported to an analyst by a user of surface analysis services regarding the selection and preparation of samples presented for surface analysis. Such information is required to ensure that the sample has been selected, processed, handled and stored in a manner consistent with the analysis objective, to insure the reliability and reproducibility of the analyses. This information should also appear, as appropriate to the analyses and planned data use, in a data record books, datasheets, certificates of analysis, reports or other publications. This information should be in addition to other details associated with to specimens to be analyzed, including synthesis information, processing history and other characterization that should become part of the data record (sometimes identified as provenance information) regarding the source of the material and changes that have taken place since it was originated. This document also includes informative annexes as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly: Auger electron spectroscopy (AES), Secondary ion mass spectrometry (SIMS), and X-ray photoelectron spectroscopy (XPS or ESCA). The information presented may also be applicable for other analytical techniques, such as TXRF, that are sensitive to surface composition. This document does not define the nature of instrumentation or operating procedures needed to ensure that the analytical measurements described have been appropriately conducted.
Текущий статус : Under development
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Технический комитет:General procedures