Тезис Предпросмотр
This document specifies a low-voltage test method for detecting and locating defects (pores, cracks or pop-offs) that occur in enamel coatings of corrugated and/or undulated profiles and that extend down to the metal base.
The method is based on colour effects (optical method) and is applicable to the precise detection of defects and their exact position. It can be used for non-flat, more profiled shapes such as corrugated or undulated surfaces.
NOTE The low-voltage test is a non-destructive test for detecting defects extending down to the metal base and is, therefore, completely different in comparison to the high-voltage test in accordance with ISO 2746.
Общая информация
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Текущий статус : PublishedДата публикации : 2019-03
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Версия : 1
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- ICS :
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Enamels
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| Формат | Язык | |
|---|---|---|
| PDF + ePub | ||
| Бумажный |
- CHF38
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