ISO 20263:2017

недоступно на русском языке

Текущий статус : Опубликовано (Будет пересмотрено)

Это стандарт будет замененоISO/DIS 20263

	Формат	Язык
std 1 166	PDF + ePub
std 2 166	Бумажный

CHF166

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Тезис

ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.

Общая информация

Текущий статус
: Опубликовано

Дата публикации
: 2017-11

Этап
: Между-народный стандарт подлежит пересмотру [90.92]
Версия
: 1
Технический комитет :
ISO/TC 202/SC 3

ICS :
37.020 71.040.50
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