Тезис

ISO 15632 defines the most important quantities that characterize an energy dispersive X-ray spectrometer (EDS) consisting of a semiconductor detector, a pre-amplifier and a signal processing unit as the essential parts. This International Standard is only applicable to spectrometers with semiconductor detectors operating on the principle of solid state ionization. It specifies minimum requirements for such spectrometers attached to an electron probe microanalyser (EPMA) or a scanning electron microscope (SEM). Realization of the analysis is outside the scope of this International Standard.


Общая информация 

  • Текущий статус
     : Отозвано
    Дата публикации
     : 2002-12
  • Версия
     : 1
  • Технический комитет
     : ISO/TC 202 Microbeam analysis
  • ICS
     :
    37.020 Optical equipment
    71.040.99 Other standards related to analytical chemistry

Жизненный цикл

Появились вопросы?

Ознакомьтесь с FAQ

Работа с клиентами
+41 22 749 08 88

Часы работы:
Понедельник – пятница: 09:00-12:00, 14:00-17:00 (UTC+1)

  2. Интернет-магазин
  3. Каталог стандартов
  4. ТК
  5. ISO/TC 202
  6. ISO 15632:2002