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Стандарт и/или проект находящийся в компетенции ISO/TC 202/SC 2 Секретариата Этап ICS
ISO 11938:2012
Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
90.93
ISO 14594:2003
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
95.99
ISO 14594:2003/Cor 1:2009
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy — Technical Corrigendum 1
95.99
ISO 14594:2014
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
90.92
ISO/WD 14594
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
20.00
ISO 14595:2003
Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
95.99
ISO 14595:2003/Cor 1:2005
Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs) — Technical Corrigendum 1
95.99
ISO 14595:2014
Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
90.92
ISO/AWI 14595
Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
20.00
ISO 16592:2006
Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
95.99
ISO 16592:2012
Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
90.93
ISO 17470:2004
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
95.99
ISO 17470:2014
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
90.93
ISO 19463:2018
Microbeam analysis — Electron probe microanalyser (EPMA) — Guidelines for performing quality assurance procedures
60.60
ISO 22489:2006
Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
95.99
ISO 22489:2016
Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
60.60
ISO/FDIS 23692
Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product
50.00

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