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ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.


Informations générales 

  • État actuel
     : Publiée
    Date de publication
     : 2017-11
  • Edition
     : 1
  • Comité technique
     : ISO/TC 202/SC 3 Microscopie analytique à électrons
  • ICS
     :
    37.020 Matériel optique
    71.040.50 Méthodes d'analyse physico-chimique

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